Die Per Wafer Formula:
From: | To: |
The Die Per Wafer (DPW) calculation estimates the number of complete dies that can be fabricated on a single semiconductor wafer. This is a crucial metric in semiconductor manufacturing for cost estimation and production planning.
The calculator uses the DPW formula:
Where:
Explanation: The first term calculates the theoretical maximum dies based on wafer area, while the second term accounts for edge loss and non-rectangular die shapes.
Details: Accurate DPW calculation is essential for semiconductor cost modeling, production yield estimation, and manufacturing efficiency analysis. It helps determine the economic viability of chip designs.
Tips: Enter wafer diameter in millimeters and die area in square millimeters. Both values must be positive numbers for accurate calculation.
Q1: Why subtract the second term in the formula?
A: The second term accounts for dies that are lost due to the circular shape of the wafer and incomplete dies at the edges.
Q2: Does this formula account for wafer edge exclusion?
A: The formula provides a general estimation. In practice, additional edge exclusion (typically 3-5mm) is often applied for quality control.
Q3: How accurate is this calculation?
A: This provides a good first-order approximation. Actual die count may vary based on die aspect ratio, scribe lines, and wafer flat/notch orientation.
Q4: Can this be used for rectangular dies?
A: Yes, the formula works for rectangular dies as it uses the total die area in the calculation.
Q5: What about different wafer sizes?
A: The formula works for any wafer diameter, from small 100mm wafers to modern 300mm and larger wafers.